題 目：Optimization of an opportunistic maintenance policy for components under condition monitoring
主講人：Hao Peng博士 Eindhoven University of Technology（荷蘭）
時 間：2013年2月28日 下午：2:00-3:00
地 點：主樓418會議室
主講人簡介：
Dr. Hao Peng, lecturer, at Department of Industrial Engineering & Innovation Sciences,Operations, Planning, Accounting, and Control group, Eindhoven University of Technology, Netherland. She got her PhD in Industrial Engineering in 2010 from University of Houston, and her B.S. in Industrial Engineering in 2006 from Tsinghua University, Beijing, China. She has published more than 10 papers in international Journals such as IEEE Transactions on Reliability and Quality and Reliability Engineering International. Her Research Interests are on condition-based maintenance, quality and reliability engineering, applied probability and statistics.
(Note：She enrolled a PhD student who graduated from School of Management & Economics, BIT)
內(nèi)容簡介：
Due to the advanced sensor technologies nowadays, we can continuously monitor the degradation behavior of critical components in a system to prevent the unexpected failures by employing condition-based maintenance (CBM) policies. For complex engineering systems, usually not all of the components are applicable for CBM. The other components in the system may subject to corrective maintenance or periodic preventive maintenance. How to coordinate these different maintenance policies becomes a challenging problem. In this research, we propose a new optimization model to determine the control limits of opportunistic maintenance for a monitored component. It considers the chances to maintain this monitored component together with other components subject to corrective maintenance or periodic preventive maintenance. A case study on lithography machines in semiconductor industry is provided, which shows the utilization of our model.
